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Issue No.03 - May/June (2006 vol.23)
pp: 234-243
Vincent Kerz?rho , Philips Semiconductors and LIRMM
Philippe Cauvet , Philips Semiconductors
ABSTRACT
Editor's note: Testing mixed-signal circuits remains one of the most difficult challenges within the semiconductor industry. In this article, the authors present a novel DFT technique to test sets of ADCs and DACs embedded in a complex SiP. The technique provides fully digital testing on the converters to significantly reduce the cost of testing.
INDEX TERMS
ADC, DAC, mixed-signal testing, DFT, SiP, system-in-package
CITATION
Vincent Kerz?rho, Philippe Cauvet, Serge Bernard, Florence Aza?, Mariane Comte, Michel Renovell, "A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs", IEEE Design & Test of Computers, vol.23, no. 3, pp. 234-243, May/June 2006, doi:10.1109/MDT.2006.59
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