Issue No.03 - May/June (2006 vol.23)
Published by the IEEE Computer Society
Fabian Vargas , General Chair, LATW '06
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2006.58
The author presents highlights from the 7th Annual IEEE Latin American Test Workshop (LATW '06), held in the capital city of Buenos Aires, Argentina, 26-29 March.
The 7th Annual IEEE Latin American Test Workshop (LATW '06) was held in the capital city of Buenos Aires, Argentina, 26–29 March. A diverse audience represented by 19 countries from Latin America, Europe, North America, and Asia attended the event. LATW '06 was co-organized by the Catholic University (PUCRS, Brazil) and the National Institute of Industrial Technology (INTI, Argentina) and sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC).
The program committee comprised 71 specialists—most of them recognized worldwide—from 20 countries on four continents. In addition to distinguished professors and several students, there was a strong representation from industry and government institutions. Freescale, Logic Vision, Motorola, IBM, Magma Design Automation, STMicroelectronics, Uruguay's Ursec (Communication Services Regulatory Unit), Brazil's Cesar (Recife Center for Advanced Studies and Systems) and FITec, and Argentina's CNEA (National Atomic Energy Commission) and INTI, among others, actively participated in the workshop.
Fifty regular papers and five short papers were submitted to the technical program. Fifteen technical sessions covered all aspects of test technology. An Embedded Tutorial Slots session comprised three presentations: "Process Variations: Its Impact on Design and Test of CMOS Circuits" (presented by Kaushik Roy, Purdue University), "ATPG-Based Techniques for Verification" (presented by Dhiraj Pradhan, University of Bristol), and "Parametric Failures and Detection Strategies" (presented by Chuck Hawkins, University of New Mexico). In keeping with LATW tradition, the first day of LATW '06 was dedicated to the IEEE Test Technology Educational Program (TTEP), comprising two tutorials: "Memory Test and Self-Test for Deep-Submicron Technologies" and "Design for Manufacturability."
The welcome reception provided a flavor of local food, wines, and soft drinks. The social event was split into two outstanding programs: a dinner and tango show in the Piazzolla Tango Theater and a visit to the Colón Theater, a popular destination for visitors and world-renowned artists for 200 years.
The 8th LATW will be held in March 2007 in Peru. This promises to be another outstanding workshop in a country full of traditions and historic cities such as Cuzco and Machu Picchu. These historic places showcase the real masterpieces of the Inca civilization.