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May/June 2006 (vol. 23 no. 3)
pp. 182-184
Sachin Sapatnekar, University of Minnesota
Grant Martin, Tensilica
The 43rd Design Automation Conference presents leading-edge industry practices and academic research across IC, embedded-systems, and "beyond the die" design technologies and methodologies. The authors discuss the highlights, from keynote talks by reknowned personalities in the semiconductor industry to hands-on tutorials.
Index Terms:
Design Automation Conference, DAC
Citation:
Sachin Sapatnekar, Grant Martin, "DAC Highlights," IEEE Design & Test of Computers, vol. 23, no. 3, pp. 182-184, May-June 2006, doi:10.1109/MDT.2006.66
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