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March/April 2006 (vol. 23 no. 2)
pp. 164-166
Summaries of panel sessions from the 2005 International Test Conference.
Index Terms:
International Test Conference, ITC 2005, multicore testing, design for testability, soft errors, test compression
Citation:
Carol Stolicny, "ITC 2005 panels," IEEE Design & Test of Computers, vol. 23, no. 2, pp. 164-166, March-April 2006, doi:10.1109/MDT.2006.45
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