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Issue No.02 - March/April (2006 vol.23)
pp: 164-166
ABSTRACT
Summaries of panel sessions from the 2005 International Test Conference.
INDEX TERMS
International Test Conference, ITC 2005, multicore testing, design for testability, soft errors, test compression
CITATION
Carol Stolicny, "ITC 2005 panels", IEEE Design & Test of Computers, vol.23, no. 2, pp. 164-166, March/April 2006, doi:10.1109/MDT.2006.45
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