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Issue No.02 - March/April (2006 vol.23)
pp: 118-126
John M. Carulli Jr. , Texas Instruments
Thomas J. Anderson , Texas Instruments
Editor's note: A difficulty in reliability modeling is how to capture all of the various reliability defect types. This is a particularly difficult challenge because defect data varies based on fab, technology maturity, and product details. This article describes the framework and models for representing a multitude of reliability defects. --Phil Nigh, IBM Microelectronics
reliability, burn-in, early failure rate, DPPM
John M. Carulli Jr., Thomas J. Anderson, "The Impact of Multiple Failure Modes on Estimating Product Field Reliability", IEEE Design & Test of Computers, vol.23, no. 2, pp. 118-126, March/April 2006, doi:10.1109/MDT.2006.53
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