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Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers
March/April 2006 (vol. 23 no. 2)
pp. 100-109
Ritesh P. Turakhia, Portland State University
W. Robert Daasch, Portland State University
Joel Lurkins, LSI Logic
Brady Benware, LSI Logic
Editor's note: An emerging opportunity is to use statistical analysis of parametric measurements to improve the effectiveness and efficiency of testing and reliability defect stressing. In this article, the authors propose a "statistical testing" framework that combines testing, analysis, and optimization to identify latent-defect signatures --Phil Nigh, IBM Microelectronics
Index Terms:
reliability, statistical outlier screening, data modeling, adaptive testing
Citation:
Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware, "Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers," IEEE Design & Test of Computers, vol. 23, no. 2, pp. 100-109, March-April 2006, doi:10.1109/MDT.2006.37
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