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Phil Nigh, IBM Microelectronics
Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.
Index Terms:
latent defects, reliability defects, latent-defect screening, defect acceleration, burn-in, DPPM
Citation:
Phil Nigh, "Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects," IEEE Design & Test of Computers, vol. 23, no. 2, pp. 86-87, March-April 2006, doi:10.1109/MDT.2006.41
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