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Issue No.02 - March/April (2006 vol.23)
pp: 85
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
ABSTRACT
<em>D&T</em> editor in chief Tim Cheng discusses the industry's struggle to screen latent defects for complex ICs. He also welcomes two new editors to the <em>D&T</em> editorial board.
INDEX TERMS
latent defects, burn-in, IDDQ, technology scaling, embedded systems
CITATION
Kwang-Ting (Tim) Cheng, "Dealing with Early Life Failures", IEEE Design & Test of Computers, vol.23, no. 2, pp. 85, March/April 2006, doi:10.1109/MDT.2006.39
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