This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Dealing with Early Life Failures
March/April 2006 (vol. 23 no. 2)
pp. 85
Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
D&T editor in chief Tim Cheng discusses the industry's struggle to screen latent defects for complex ICs. He also welcomes two new editors to the D&T editorial board.
Index Terms:
latent defects, burn-in, IDDQ, technology scaling, embedded systems
Citation:
Kwang-Ting (Tim) Cheng, "Dealing with Early Life Failures," IEEE Design & Test of Computers, vol. 23, no. 2, pp. 85, March-April 2006, doi:10.1109/MDT.2006.39
Usage of this product signifies your acceptance of the Terms of Use.