CSDL - IEEE Design and Test of Computers

Design&Test
2006
Issue No. 1 - January/February

	This Publication

	Subscribe to this Publication Login to access your subscribed content RSS feed for this Publication
	Bibliographic References
	ASCII Text BibTex RefWorks Procite/RefMan/EndNote

IEEE Design & Test of Computers

January/February 2006 (vol. 23 no. 1)

ISSN: 0740-7475

Table of Contents

Automated Source-Level Error Localization in Hardware Designs (Abstract)

Bernhard Peischl, Technische Universitat Graz Institute for Software Technology (IST)

Franz Wotawa, Technische Universitat Graz Institute for Software Technology (IST)

pp. 8-19

PDF

HTML

PURCHASE ARTICLE: $19

IEEE Xplore Subscribers

MOSFET Mismatch Modeling: A New Approach (Abstract)

Hamilton Klimach, Federal University of Rio Grande do Sul

Carlos Galup-Montoro, Federal University of Santa Catarina

M?rcio C. Schneider, Federal University of Santa Catarina

Alfredo Arnaud, Catholic University of Uruguay

pp. 20-29

PDF

HTML

PURCHASE ARTICLE: $19

IEEE Xplore Subscribers

Logic Design for Printability Using OPC Methods (Abstract)

Kevin Lucas, Freescale Semiconductor

Chi-Min Yuan, Freescale Semiconductor

Robert Boone, Freescale Semiconductor

Karl Wimmer, Freescale Semiconductor

Kirk Strozewski, Freescale Semiconductor

Olivier Toublan, Mentor Graphics Europe

pp. 30-37

PDF

HTML

PURCHASE ARTICLE: $19

IEEE Xplore Subscribers

Efficient Parametric Fault Detection in Switched-Capacitor Filters (Abstract)

Antonio Petraglia, Federal University of Rio de Janeiro

Jorge M. Ca?ive, Federal University of Rio de Janeiro

Mariane R. Petraglia, Federal University of Rio de Janeiro

pp. 58-66

PDF

HTML

PURCHASE ARTICLE: $19

IEEE Xplore Subscribers

Peer Review Notice | Give Us Feedback

Usage of this product signifies your acceptance of the Terms of Use.

Print and Online Advertising Opportunities