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November/December 2005 (vol. 22 no. 6)
pp. 604-615
| ASCII Text | x | ||
| "<em>IEEE Design & Test of Computers</em>, 2005 Annual Index, Volume 22," IEEE Design & Test of Computers, vol. 22, no. 6, pp. 604-615, November/December, 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2005.123, author = {}, title = {<em>IEEE Design & Test of Computers</em>, 2005 Annual Index, Volume 22}, journal ={IEEE Design & Test of Computers}, volume = {22}, number = {6}, issn = {0740-7475}, year = {2005}, pages = {604-615}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.123}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - <em>IEEE Design & Test of Computers</em>, 2005 Annual Index, Volume 22 IS - 6 SN - 0740-7475 SP604 EP615 EPD - 604-615 PY - 2005 VL - 22 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.123
Citation:
"IEEE Design & Test of Computers, 2005 Annual Index, Volume 22," IEEE Design & Test of Computers, vol. 22, no. 6, pp. 604-615, Nov.-Dec. 2005, doi:10.1109/MDT.2005.123
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