Issue No.06 - November/December (2005 vol.22)
Sagar S. Sabade , Texas Instruments
Duncan M. Walker , Texas A&M University
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.143
The use of IDDQ as a test method has been threatened by high leakage currents in nanometer designs. This article suggests a method for keeping it useful and also delineates some of the challenges in recognizing and rejecting outlier parts.
Control Structure Reliability, Testing, and Fault-Tolerance, Reliability and Testing
Sagar S. Sabade, Duncan M. Walker, "IC Outlier Identification Using Multiple Test Metrics", IEEE Design & Test of Computers, vol.22, no. 6, pp. 586-595, November/December 2005, doi:10.1109/MDT.2005.143