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IC Outlier Identification Using Multiple Test Metrics
November/December 2005 (vol. 22 no. 6)
pp. 586-595
Sagar S. Sabade, Texas Instruments
Duncan M. Walker, Texas A&M University
The use of IDDQ as a test method has been threatened by high leakage currents in nanometer designs. This article suggests a method for keeping it useful and also delineates some of the challenges in recognizing and rejecting outlier parts.
Index Terms:
Control Structure Reliability, Testing, and Fault-Tolerance, Reliability and Testing
Citation:
Sagar S. Sabade, Duncan M. Walker, "IC Outlier Identification Using Multiple Test Metrics," IEEE Design & Test of Computers, vol. 22, no. 6, pp. 586-595, Nov.-Dec. 2005, doi:10.1109/MDT.2005.143
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