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A Novel Transition Fault ATPG That Reduces Yield Loss
November/December 2005 (vol. 22 no. 6)
pp. 576-584
Xiao Liu, Texas Instruments
Michael S. Hsiao, Virginia Polytechnic Institute and State University
Transition delay tests are crucial to finding ICs with timing defects, but they can also find functionally untestable timing-related faults, thus reducing yield. This article describes an ATPG with constraints that prevent it from using the illegal states that lead to this overtesting.
Index Terms:
Hardware I Computing Methodologies
Citation:
Xiao Liu, Michael S. Hsiao, "A Novel Transition Fault ATPG That Reduces Yield Loss," IEEE Design & Test of Computers, vol. 22, no. 6, pp. 576-584, Nov.-Dec. 2005, doi:10.1109/MDT.2005.126
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