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X-Tolerant Test Response Compaction
November/December 2005 (vol. 22 no. 6)
pp. 566-574
Steven S. Lumetta, University of Illinois at Urbana-Champaign
Michael Mitzenmacher, Harvard University
Larger, denser designs lead to more defects; higher quality requirements and new test methods lead to an explosion in test data volume. Test compression techniques attempt to do more testing with fewer bits. This article summarizes one such method, X-compact, which addresses how unknowns, the bane of compression and logic BIST techniques, are eliminated.
Index Terms:
VLSI Test, Testability, Built-In Test
Citation:
Subhasish Mitra, Steven S. Lumetta, Michael Mitzenmacher, Nishant Patil, "X-Tolerant Test Response Compaction," IEEE Design & Test of Computers, vol. 22, no. 6, pp. 566-574, Nov.-Dec. 2005, doi:10.1109/MDT.2005.154
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