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November/December 2005 (vol. 22 no. 6)
pp. 565
Scott Davidson, Sun Microsystems
The theme of the 2005 International Test Conference is "Test: Survival of the Fittest." In conjunction with this year's ITC, this special section examines how test helps the fittest of the industry's chips, boards, and systems survive manufacturing to reach its customers. These articles discuss topics such as X-tolerant test response compaction, reducing yield loss using a constrained ATPG, and using IDDQ testing with today's high background currents.
Index Terms:
International Test Conference, X-tolerant, BIST, ATPG, yield, IDDQ, test metrics, IC outlier
Citation:
Scott Davidson, "Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive," IEEE Design & Test of Computers, vol. 22, no. 6, pp. 565, Nov.-Dec. 2005, doi:10.1109/MDT.2005.141
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