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IEEE Design & Test of Computers
September/October 2005 (vol. 22 no. 5)
ISSN: 0740-7475
Table of Contents
 | From the EIC |
 | DAC Report |
 | Features |
Se-Joong Lee, Korea Advanced Institute of Science and Technology
Kangmin Lee, Korea Advanced Institute of Science and Technology
Hoi-Jun Yoo, Korea Advanced Institute of Science and Technology
pp. 422-433
 | Special Features |
Diederik Verkest, University of Brussels, Katholieke Universiteit Leuven, and IMEC
pp. 452-460
 | Interview |
 | Book Reviews |
 | Conference Reports |
 | Panel Summaries |
 | Standards |
 | DATC Newsletter |
 | The Last Byte |
Res Saleh, Natural Sciences and Engineering Research Council of Canada, PMC-Sierra Inc., and University of British Columbia
pp. 488
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