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Issue No.05 - September/October (2005 vol.22)
pp: 480-481
ABSTRACT
The 10th European Test Symposium (ETS 05) took place in Tallinn, Estonia. This year, the number of Eastern European participants was the highest in symposium history. Full-day tutorials included one on digital test given by Yervant Zorian (Virage Logic, US) and one on analog test given by J. Huertas (IMSE-CNM, Spain). The technical program also featured three plenary keynote addresses, interactive paper presentations in two parallel tracks, four embedded tutorials, four poster sessions, and two evening panels. <p>The 14th IEEE North Atlantic Test Workshop (NATW 05) took place from 11 to 13 May 2005 in Essex Junction, Vermont. Preceding this year?s workshop were two half-day tutorials, "Outlier Screening" and "Embedded Test--Enabling Technology for Product Quality and Yield Management." An evening panel session discussed the future of defect-based test and yield management, including random versus systematic defects. Garry Hughes (IBM) delivered the keynote address, "Striking a New Balance in the Nanometer Era: First-Time-Right and Time-to-Market Demands Versus Technology Challenges."</p>
INDEX TERMS
ETS 05, TTTC, European Test Workshop, Eastern Europe, NATW 05, outlier screening, embedded test, defect-based test, yield management, analog test
CITATION
"Conference Reports", IEEE Design & Test of Computers, vol.22, no. 5, pp. 480-481, September/October 2005, doi:10.1109/MDT.2005.106
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