This Article 
 Bibliographic References 
 Add to: 
Conference Reports
September/October 2005 (vol. 22 no. 5)
pp. 480-481
The 10th European Test Symposium (ETS 05) took place in Tallinn, Estonia. This year, the number of Eastern European participants was the highest in symposium history. Full-day tutorials included one on digital test given by Yervant Zorian (Virage Logic, US) and one on analog test given by J. Huertas (IMSE-CNM, Spain). The technical program also featured three plenary keynote addresses, interactive paper presentations in two parallel tracks, four embedded tutorials, four poster sessions, and two evening panels.

The 14th IEEE North Atlantic Test Workshop (NATW 05) took place from 11 to 13 May 2005 in Essex Junction, Vermont. Preceding this year?s workshop were two half-day tutorials, "Outlier Screening" and "Embedded Test--Enabling Technology for Product Quality and Yield Management." An evening panel session discussed the future of defect-based test and yield management, including random versus systematic defects. Garry Hughes (IBM) delivered the keynote address, "Striking a New Balance in the Nanometer Era: First-Time-Right and Time-to-Market Demands Versus Technology Challenges."

Index Terms:
ETS 05, TTTC, European Test Workshop, Eastern Europe, NATW 05, outlier screening, embedded test, defect-based test, yield management, analog test
"Conference Reports," IEEE Design & Test of Computers, vol. 22, no. 5, pp. 480-481, Sept.-Oct. 2005, doi:10.1109/MDT.2005.106
Usage of this product signifies your acceptance of the Terms of Use.