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Conference Reports
September/October 2005 (vol. 22 no. 5)
pp. 480-481
| ASCII Text | x | ||
| "Conference Reports," IEEE Design & Test of Computers, vol. 22, no. 5, pp. 480-481, September/October, 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2005.106, author = {}, title = {Conference Reports}, journal ={IEEE Design & Test of Computers}, volume = {22}, number = {5}, issn = {0740-7475}, year = {2005}, pages = {480-481}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.106}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Conference Reports IS - 5 SN - 0740-7475 SP480 EP481 EPD - 480-481 PY - 2005 KW - ETS 05 KW - TTTC KW - European Test Workshop KW - Eastern Europe KW - NATW 05 KW - outlier screening KW - embedded test KW - defect-based test KW - yield management KW - analog test VL - 22 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.106
The 10th European Test Symposium (ETS 05) took place in Tallinn, Estonia. This year, the number of Eastern European participants was the highest in symposium history. Full-day tutorials included one on digital test given by Yervant Zorian (Virage Logic, US) and one on analog test given by J. Huertas (IMSE-CNM, Spain). The technical program also featured three plenary keynote addresses, interactive paper presentations in two parallel tracks, four embedded tutorials, four poster sessions, and two evening panels.
The 14th IEEE North Atlantic Test Workshop (NATW 05) took place from 11 to 13 May 2005 in Essex Junction, Vermont. Preceding this year?s workshop were two half-day tutorials, "Outlier Screening" and "Embedded Test--Enabling Technology for Product Quality and Yield Management." An evening panel session discussed the future of defect-based test and yield management, including random versus systematic defects. Garry Hughes (IBM) delivered the keynote address, "Striking a New Balance in the Nanometer Era: First-Time-Right and Time-to-Market Demands Versus Technology Challenges."
Index Terms:
ETS 05, TTTC, European Test Workshop, Eastern Europe, NATW 05, outlier screening, embedded test, defect-based test, yield management, analog test
Citation:
"Conference Reports," IEEE Design & Test of Computers, vol. 22, no. 5, pp. 480-481, Sept.-Oct. 2005, doi:10.1109/MDT.2005.106
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