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Issue No.04 - July/August (vol.22)
ISSN: 0740-7475
TABLE OF CONTENTS
From the EIC
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 289, 294
Special Announcement
Giovanni De Micheli , IEEE Council for Electronic Design Automation
pp. 293-294
Features
Darshan D. Thaker , University of California, Davis
Francois Impens , Massachusetts Institute of Technology
Isaac L. Chuang , Massachusetts Institute of Technology
Rajeevan Amirtharajah , University of California, Davis
Frederic T. Chong , University of California, Santa Barbara
pp. 298-305
Andr? DeHon , California Institute of Technology
Helia Naeimi , California Institute of Technology
pp. 306-315
Margarida F. Jacome , University of Texas at Austin
Chen He , University of Texas at Austin and Freescale Semiconductor Inc.
pp. 316-326
Jianbo Gao , University of Florida
Yan Qi , Johns Hopkins University
Pieter Jonker , Delft University of Technology
Jos? A.B. Fortes , University of Florida
pp. 328-339
Special Features
Andr? K. Nieuwland , Philips Research Laboratories
Atul Katoch , Philips Research Laboratories
Daniele Rossi , University of Bologna
pp. 340-348
Mark L. Chang , Franklin W. Olin College of Engineering
pp. 349-361
Sujit Dey , University of California, San Diego
Chong Zhao , University of California, San Diego
pp. 362-375
Rajeev R. Rao , University of Michigan, Ann Arbor
David Blaauw , University of Michigan, Ann Arbor
Dennis Sylvester , University of Michigan, Ann Arbor
Anirudh Devgan , Magma Design Automation
pp. 376-385
Book Reviews
Scott Davidson , Sun Microsystems
pp. 386-387
Panel Summaries
Luigi Carro , Federal University of Rio Grande do Sul
pp. 388, 390
Conference Reports
Conference Reports (Abstract)
pp. 389-390
DATC Newsletter
The Last Byte
What's the problem? (Abstract)
Scott Davidson , Sun Microsystems
pp. 392
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