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Soft Errors in Advanced Computer Systems
May/June 2005 (vol. 22 no. 3)
pp. 258-266
Robert Baumann, Texas Instruments
This article comprehensively analyzes soft-error sensitivity in modern systems and shows it to be application dependent. The discussion covers ground-level radiation mechanisms that have the most serious impact on circuit operation, along with the effect of technology scaling on soft-error rates in memory and logic.
Index Terms:
soft-error sensitivity, ground-level radiation mechanism, circuit operation, technology scaling
Citation:
Robert Baumann, "Soft Errors in Advanced Computer Systems," IEEE Design & Test of Computers, vol. 22, no. 3, pp. 258-266, May-June 2005, doi:10.1109/MDT.2005.69
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