Issue No.03 - May/June (2005 vol.22)
Robert Baumann , Texas Instruments
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.69
This article comprehensively analyzes soft-error sensitivity in modern systems and shows it to be application dependent. The discussion covers ground-level radiation mechanisms that have the most serious impact on circuit operation, along with the effect of technology scaling on soft-error rates in memory and logic.
soft-error sensitivity, ground-level radiation mechanism, circuit operation, technology scaling
Robert Baumann, "Soft Errors in Advanced Computer Systems", IEEE Design & Test of Computers, vol.22, no. 3, pp. 258-266, May/June 2005, doi:10.1109/MDT.2005.69