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Value-Added Defect Testing Techniques
May/June 2005 (vol. 22 no. 3)
pp. 224-231
Jay Jahangiri, Mentor Graphics
David Abercrombie, Mentor Graphics
This article describes advanced design-for-manufacturability (DFM) test methods that target defect coverage, yield learning, and cost. The authors argue that testing can be useful for more than filtering chips: It can directly help target test patterns, provide DFM tools, and reduce overall costs.
Index Terms:
advanced design-for-manufacturability, DFM test methods, defect testing techniques
Citation:
Jay Jahangiri, David Abercrombie, "Value-Added Defect Testing Techniques," IEEE Design & Test of Computers, vol. 22, no. 3, pp. 224-231, May-June 2005, doi:10.1109/MDT.2005.74
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