|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
Value-Added Defect Testing Techniques
May/June 2005 (vol. 22 no. 3)
pp. 224-231
| ASCII Text | x | ||
| Jay Jahangiri, David Abercrombie, "Value-Added Defect Testing Techniques," IEEE Design & Test of Computers, vol. 22, no. 3, pp. 224-231, May/June, 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2005.74, author = {Jay Jahangiri and David Abercrombie}, title = {Value-Added Defect Testing Techniques}, journal ={IEEE Design & Test of Computers}, volume = {22}, number = {3}, issn = {0740-7475}, year = {2005}, pages = {224-231}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.74}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Value-Added Defect Testing Techniques IS - 3 SN - 0740-7475 SP224 EP231 EPD - 224-231 A1 - Jay Jahangiri, A1 - David Abercrombie, PY - 2005 KW - advanced design-for-manufacturability KW - DFM test methods KW - defect testing techniques VL - 22 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.74
This article describes advanced design-for-manufacturability (DFM) test methods that target defect coverage, yield learning, and cost. The authors argue that testing can be useful for more than filtering chips: It can directly help target test patterns, provide DFM tools, and reduce overall costs.
Index Terms:
advanced design-for-manufacturability, DFM test methods, defect testing techniques
Citation:
Jay Jahangiri, David Abercrombie, "Value-Added Defect Testing Techniques," IEEE Design & Test of Computers, vol. 22, no. 3, pp. 224-231, May-June 2005, doi:10.1109/MDT.2005.74
Usage of this product signifies your acceptance of the Terms of Use.