Issue No.03 - May/June (2005 vol.22)
Yervant Zorian , Virage Logic
Raul Camposano , Synopsys
Andrzej J. Strojwas , PDF Solutions Inc.
John K. Kibarian , PDF Solutions Inc.
Dennis Wassung , Adams Harkness Inc.
Alex Alexanian , Pont? Solutions Inc.
Juan-Antonio Carballo , IBM Corp.
Neil Kelly , LTX Corp.
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.61
Design for manufacturability (DFM) has thus far been the focus of extensive study in the semiconductor industry. Although deep-submicron processes enable the manufacture of area-efficient, high-performance chips, navigating the nanometer landscape presents enormous manufacturability challenges.
Design for manufacturability, DFM
Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John K. Kibarian, Dennis Wassung, Alex Alexanian, Juan-Antonio Carballo, Neil Kelly, "Guest Editors' Introduction: DFM Drives Changes in Design Flow", IEEE Design & Test of Computers, vol.22, no. 3, pp. 200-205, May/June 2005, doi:10.1109/MDT.2005.61