Issue No.03 - May/June (2005 vol.22)
Andrew B. Kahng , University of California, San Diego
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.55
This year's Design Automation Conference represents the best of leading-edge industry practices and academic research across all IC and embedded-systems design technologies and methodologies. As cochairs of the technical program committee, we worked with more than 70 technical program committee members, reviewing more than 730 papers with hundreds of external reviewers, generating several thousand reviews in total.
Design Automation Conference, DAC
Andrew B. Kahng, "DAC Highlights", IEEE Design & Test of Computers, vol.22, no. 3, pp. 197-199, May/June 2005, doi:10.1109/MDT.2005.55