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IEEE Design & Test of Computers
March/April 2005 (vol. 22 no. 2)
ISSN: 0740-7475
Table of Contents
From the EIC
Rajesh Gupta, Editor in Chief, IEEE Design & Test
pp. 81
Features
Bingfeng Mei, IMEC and Katholieke Universiteit Leuven
Andy Lambrechts, IMEC and Katholieke Universiteit Leuven
Diederik Verkest, IMEC, Katholieke Universiteit Leuven, and Vrije Universiteit Brussel
Rudy Lauwereins, IMEC and Katholieke Universiteit Leuven
pp. 90-101
Miljan Vuletic, Ecole Polytechnique F?d?rale de Lausanne
Laura Pozzi, Ecole Polytechnique F?d?rale de Lausanne
Paolo Ienne, Ecole Polytechnique F?d?rale de Lausanne
pp. 102-113
Chen Chang, University of California, Berkeley
John Wawrzynek, University of California, Berkeley
Robert W. Brodersen, University of California, Berkeley
pp. 114-125
Special Features
J? Becker, University of Karlsruhe
Alexander Thomas, University of Karlsruhe
pp. 136-148
Chulsung Park, University of California, Irvine
Jinfeng Liu, University of California, Irvine
Pai H. Chou, University of California, Irvine
pp. 150-159
Ming Shae Wu, National Chiao Tung University
Chung Len Lee, National Chiao Tung University
pp. 160-169
Standards
Book Reviews
Panel Summaries
Newsletter
The Last Byte
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