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Issue No.02 - March/April (vol.22)
ISSN: 0740-7475
TABLE OF CONTENTS
From the EIC
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 81
Features
Bingfeng Mei , IMEC and Katholieke Universiteit Leuven
Andy Lambrechts , IMEC and Katholieke Universiteit Leuven
Diederik Verkest , IMEC, Katholieke Universiteit Leuven, and Vrije Universiteit Brussel
Rudy Lauwereins , IMEC and Katholieke Universiteit Leuven
pp. 90-101
Miljan Vuletic , Ecole Polytechnique F?d?rale de Lausanne
Laura Pozzi , Ecole Polytechnique F?d?rale de Lausanne
Paolo Ienne , Ecole Polytechnique F?d?rale de Lausanne
pp. 102-113
Chen Chang , University of California, Berkeley
John Wawrzynek , University of California, Berkeley
Robert W. Brodersen , University of California, Berkeley
pp. 114-125
Special Features
J? Becker , University of Karlsruhe
Alexander Thomas , University of Karlsruhe
pp. 136-148
Chulsung Park , University of California, Irvine
Jinfeng Liu , University of California, Irvine
Pai H. Chou , University of California, Irvine
pp. 150-159
Ming Shae Wu , National Chiao Tung University
Chung Len Lee , National Chiao Tung University
pp. 160-169
Standards
Victor Berman , Cadence Design Systems
pp. 182-183
Book Reviews
Panel Summaries
pp. 186-189
Newsletter
DATC Newsletter (Abstract)
pp. 190
The Last Byte
Tom Kean , Algotronix Ltd.
pp. 192
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