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Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults
March/April 2005 (vol. 22 no. 2)
pp. 160-169
Ming Shae Wu, National Chiao Tung University
Chung Len Lee, National Chiao Tung University
This BIST scheme simplifies the detection of crosstalk faults in deep-submicron VLSI circuits in the boundary scan environment. Simulation results show that with just a few random patterns, fault coverage for most large benchmark circuits can exceed 90%.
Citation:
Ming Shae Wu, Chung Len Lee, "Using a Periodic Square Wave Test Signal to Detect Crosstalk Faults," IEEE Design & Test of Computers, vol. 22, no. 2, pp. 160-169, March-April 2005, doi:10.1109/MDT.2005.49
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