|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
Test Solution Selection Using Multiple-Objective Decision Models and Analyses
March/April 2005 (vol. 22 no. 2)
pp. 126-134
| ASCII Text | x | ||
| Daniel T. Hamling, "Test Solution Selection Using Multiple-Objective Decision Models and Analyses," IEEE Design & Test of Computers, vol. 22, no. 2, pp. 126-134, March/April, 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2005.47, author = {Daniel T. Hamling}, title = {Test Solution Selection Using Multiple-Objective Decision Models and Analyses}, journal ={IEEE Design & Test of Computers}, volume = {22}, number = {2}, issn = {0740-7475}, year = {2005}, pages = {126-134}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.47}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Test Solution Selection Using Multiple-Objective Decision Models and Analyses IS - 2 SN - 0740-7475 SP126 EP134 EPD - 126-134 A1 - Daniel T. Hamling, PY - 2005 VL - 22 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.47
Editor's note: Designing new ATE frameworks in alignment with the advances in semiconductor technology remains one of the most difficult challenges in the test community. This article presents an elegant methodology for analyzing different models for ATE operation. The methodology ultimately provides a single figure of merit for evaluation and comparison.
--Fabrizio Lombardi, Northeastern University
Citation:
Daniel T. Hamling, "Test Solution Selection Using Multiple-Objective Decision Models and Analyses," IEEE Design & Test of Computers, vol. 22, no. 2, pp. 126-134, March-April 2005, doi:10.1109/MDT.2005.47
Usage of this product signifies your acceptance of the Terms of Use.