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Issue No.02 - March/April (2005 vol.22)
pp: 126-134
Daniel T. Hamling , Teradyne Inc.
ABSTRACT
Editor's note: Designing new ATE frameworks in alignment with the advances in semiconductor technology remains one of the most difficult challenges in the test community. This article presents an elegant methodology for analyzing different models for ATE operation. The methodology ultimately provides a single figure of merit for evaluation and comparison.<div>--<em>Fabrizio Lombardi, Northeastern University</em></div>
CITATION
Daniel T. Hamling, "Test Solution Selection Using Multiple-Objective Decision Models and Analyses", IEEE Design & Test of Computers, vol.22, no. 2, pp. 126-134, March/April 2005, doi:10.1109/MDT.2005.47
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