This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Testing: It's not just pass/fail anymore
January/February 2005 (vol. 22 no. 1)
pp. 80
Scott Davidson, Sun Microsystems
Citation:
Scott Davidson, "Testing: It's not just pass/fail anymore," IEEE Design & Test of Computers, vol. 22, no. 1, pp. 80, Jan.-Feb. 2005, doi:10.1109/MDT.2005.22
Usage of this product signifies your acceptance of the Terms of Use.