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| "DATC Newsletter," IEEE Design & Test of Computers, vol. 22, no. 1, pp. 79, January/February, 2005. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2005.8, author = {}, title = {DATC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {22}, number = {1}, issn = {0740-7475}, year = {2005}, pages = {79}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2005.8}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - DATC Newsletter IS - 1 SN - 0740-7475 SP EP EPD - 79 PY - 2005 VL - 22 JA - IEEE Design & Test of Computers ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2005.8
Citation:
"DATC Newsletter," IEEE Design & Test of Computers, vol. 22, no. 1, pp. 79, Jan.-Feb. 2005, doi:10.1109/MDT.2005.8
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