| | This Publication | | | | | | | |
| | | | Bibliographic References | | | |
| | | | |
IEEE Design & Test of Computers November/December 2004 (vol. 21 no. 6) ISSN: 0740-7475 Table of Contents
 | EIC Message |
 | Features |
Young-Il Kim, Korea Advanced Institute of Science and Technology
Chong-Min Kyung, Korea Advanced Institute of Science and Technology Integrated Circuit Design Education Center pp. 484-493
 | Special Features |
Ioannis Papaefstathiou, Institute of Computer Science, Foundation for Research and Technology?Hellas (ICS-FORTH) pp. 514-523
Paolo Ienne, Swiss Federal Institute of Technology Lausanne pp. 524-535
 | Departments |
 | The Last Byte | Usage of this product signifies your acceptance of the Terms of Use.
| | | | | | | |