The Community for Technology Leaders
RSS Icon
Subscribe
Issue No.06 - November/December (2004 vol.21)
pp: 524-535
Fr?d?ric Worm , Swiss Federal Institute of Technology Lausanne
Paolo Ienne , Swiss Federal Institute of Technology Lausanne
Patrick Thiran , Swiss Federal Institute of Technology Lausanne
Giovanni De Micheli , Stanford University
ABSTRACT
<it>Editor's note:</it> Dynamic self-calibration holds the promise of overcoming conservative worst-case design techniques needed to combat deep-submicron process and operating variations. This article proposes an on-chip point-to-point interconnect scheme characterized by self-calibration that can operate dynamically to achieve the best energy/performance trade-off. <it>—Soha Hassoun, Tufts University</it>
CITATION
Fr?d?ric Worm, Paolo Ienne, Patrick Thiran, Giovanni De Micheli, "On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations", IEEE Design & Test of Computers, vol.21, no. 6, pp. 524-535, November/December 2004, doi:10.1109/MDT.2004.96
17 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool