Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian, "Design & Test Education in Asia," IEEE Design & Test of Computers, vol. 21, no. 4, pp. 331-338, July/August, 2004.

@article{ 10.1109/MDT.2004.27,
author = {Debesh K. Das and Hideo Fujiwara and Yungang Li and Yinghua Min and Shiyi Xu and Yervant Zorian},
title = {Design & Test Education in Asia},
journal ={IEEE Design & Test of Computers},
volume = {21},
number = {4},
issn = {0740-7475},
year = {2004},
pages = {331-338},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.27},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - MGZN
JO - IEEE Design & Test of Computers
TI - Design & Test Education in Asia
IS - 4
SN - 0740-7475
SP331
EP338
EPD - 331-338
A1 - Debesh K. Das,
A1 - Hideo Fujiwara,
A1 - Yungang Li,
A1 - Yinghua Min,
A1 - Shiyi Xu,
A1 - Yervant Zorian,
PY - 2004
VL - 21
JA - IEEE Design & Test of Computers
ER -