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Testing Gbps Interfaces without a Gigahertz Tester
July/August 2004 (vol. 21 no. 4)
pp. 278-286
T.M. Mak, Intel
Mike Tripp, Intel
Anne Meixner, Intel
These authors from Intel provide evidence for the rapid deployment of ICs equipped with high-speed serial interfaces. They argue that this constitutes a revolutionary functional and design paradigm shift, which in turn dictates a corresponding shift in test and DFT methods. They also review various approaches and discuss the tradeoffs they experienced in testing actual devices.
Citation:
T.M. Mak, Mike Tripp, Anne Meixner, "Testing Gbps Interfaces without a Gigahertz Tester," IEEE Design & Test of Computers, vol. 21, no. 4, pp. 278-286, July-Aug. 2004, doi:10.1109/MDT.2004.42
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