Issue No.04 - July/August (2004 vol.21)
T.M. Mak , Intel
Mike Tripp , Intel
Anne Meixner , Intel
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.42
These authors from Intel provide evidence for the rapid deployment of ICs equipped with high-speed serial interfaces. They argue that this constitutes a revolutionary functional and design paradigm shift, which in turn dictates a corresponding shift in test and DFT methods. They also review various approaches and discuss the tradeoffs they experienced in testing actual devices.
T.M. Mak, Mike Tripp, Anne Meixner, "Testing Gbps Interfaces without a Gigahertz Tester", IEEE Design & Test of Computers, vol.21, no. 4, pp. 278-286, July/August 2004, doi:10.1109/MDT.2004.42