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July/August 2004 (vol. 21 no. 4)
pp. 274-276
Andr? Ivanov, University of British Columbia
Fabrizio Lombardi, Northeastern University
Cecilia Metra, University of Bologna
Citation:
Andr? Ivanov, Fabrizio Lombardi, Cecilia Metra, "Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates," IEEE Design & Test of Computers, vol. 21, no. 4, pp. 274-276, July-Aug. 2004, doi:10.1109/MDT.2004.31
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