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Issue No.04 - July/August (2004 vol.21)
pp: 274-276
Andr? Ivanov , University of British Columbia
Fabrizio Lombardi , Northeastern University
Cecilia Metra , University of Bologna
CITATION
Andr? Ivanov, Fabrizio Lombardi, Cecilia Metra, "Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates", IEEE Design & Test of Computers, vol.21, no. 4, pp. 274-276, July/August 2004, doi:10.1109/MDT.2004.31
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