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July/August 2004 (vol. 21 no. 4)
pp. 269-270
Rajesh Gupta, Editor in Chief, IEEE Design & Test
Citation:
Rajesh Gupta, "Manufacturing test woes," IEEE Design & Test of Computers, vol. 21, no. 4, pp. 269-270, July-Aug. 2004, doi:10.1109/MDT.2004.29
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