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Issue No.03 - May/June (2004 vol.21)
pp: 208-215
Alessandra Fudoli , STMicroelectronics
Katia Giarda , STMicroelectronics
Vincenzo Tancorre , STMicroelectronics
Emil Gizdarski , Synopsys
Ben Mathew , Synopsys
ABSTRACT
Yield improvement requires understanding failures and identifying potential sources of yield loss. This article focuses on diagnosing random logic circuits and classifying faults. The authors introduce an interesting scan-based diagnosis flow, which leverages the ATPG patterns originally generated for fault coverage. This flow shows an adequate link between the design automation tools and the testers, and a correlation between the ATPG patterns and the tester failure reports.
CITATION
Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew, "Understanding Yield Losses in Logic Circuits", IEEE Design & Test of Computers, vol.21, no. 3, pp. 208-215, May/June 2004, doi:10.1109/MDT.2004.21
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