Issue No.03 - May/June (2004 vol.21)
Samvel Shoukourian , Virage Logic
Valery Vardanian , Virage Logic
Yervant Zorian , Virage Logic
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/MDT.2004.19
Today, embedded memories are the most important contributor to SoC yield. To maximize embedded-memory yield, advanced test and repair solutions must be an integral part of the memory block. This article analyzes factors that affect memory yield and presents advanced techniques for maximizing their positive impact.
Samvel Shoukourian, Valery Vardanian, Yervant Zorian, "SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure", IEEE Design & Test of Computers, vol.21, no. 3, pp. 200-207, May/June 2004, doi:10.1109/MDT.2004.19