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May/June 2004 (vol. 21 no. 3)
pp. 177-182
Yervant Zorian, Virage Logic
Dimitris Gizopoulos, University of Piraeus
Cary Vandenberg, HPL Technologies
Philippe Magarshack, STMicroelectronics
Citation:
Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack, "Guest Editors' Introduction: Design for Yield and Reliability," IEEE Design & Test of Computers, vol. 21, no. 3, pp. 177-182, May-June 2004, doi:10.1109/MDT.2004.12
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