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Issue No.03 - May/June (2004 vol.21)
pp: 177-182
Dimitris Gizopoulos , University of Piraeus
Cary Vandenberg , HPL Technologies
Philippe Magarshack , STMicroelectronics
CITATION
Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack, "Guest Editors' Introduction: Design for Yield and Reliability", IEEE Design & Test of Computers, vol.21, no. 3, pp. 177-182, May/June 2004, doi:10.1109/MDT.2004.12
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