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Issue No.02 - March/April (vol.21)
ISSN: 0740-7475
TABLE OF CONTENTS
EIC Message
Rajesh Gupta , Editor in Chief, <em>IEEE Design & Test</em>
pp. 77-78
Features
Allon Adir , IBM Research Lab, Haifa
Eli Almog , IBM Research Lab, Haifa
Laurent Fournier , IBM Research Lab, Haifa
Eitan Marcus , IBM Research Lab, Haifa
Michal Rimon , IBM Research Lab, Haifa
Michael Vinov , IBM Research Lab, Haifa
Avi Ziv , IBM Research Lab, Haifa
pp. 84-93
Fulvio Corno , Politecnico di Torino
Ernesto S?nchez , Politecnico di Torino
Matteo Sonza Reorda , Politecnico di Torino
Giovanni Squillero , Politecnico di Torino
pp. 102-109
Chia-Chih Yen , National Chiao Tung University
Jing-Yang Jou , National Chiao Tung University
Kuang-Chien Chen , Cadence Design Systems
pp. 111-120
Prabhat Mishra , University of California, Irvine
Nikil Dutt , University of California, Irvine
Magdy S. Abadir , Motorola
pp. 122-131
Ganapathy Parthasarathy , University of California, Santa Barbara
Madhu K. Iyer , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
pp. 132-143
Rob Aitken , Artisan Components
Stefan Eichenberger , Philips Semiconductors
Sandip Kundu , Intel
Hank Walker , Texas A&M University
pp. 144-156
Departments
Peter J. Ashenden , Ashenden Designs
pp. 157-158
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