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IEEE Design & Test of Computers
March/April 2004 (vol. 21 no. 2)
ISSN: 0740-7475
Table of Contents
EIC Message
Rajesh Gupta, Editor in Chief, IEEE Design & Test
pp. 77-78
Features
Allon Adir, IBM Research Lab, Haifa
Eli Almog, IBM Research Lab, Haifa
Laurent Fournier, IBM Research Lab, Haifa
Eitan Marcus, IBM Research Lab, Haifa
Michal Rimon, IBM Research Lab, Haifa
Michael Vinov, IBM Research Lab, Haifa
Avi Ziv, IBM Research Lab, Haifa
pp. 84-93
Fulvio Corno, Politecnico di Torino
Ernesto S?nchez, Politecnico di Torino
Matteo Sonza Reorda, Politecnico di Torino
Giovanni Squillero, Politecnico di Torino
pp. 102-109
Chia-Chih Yen, National Chiao Tung University
Jing-Yang Jou, National Chiao Tung University
Kuang-Chien Chen, Cadence Design Systems
pp. 111-120
Prabhat Mishra, University of California, Irvine
Nikil Dutt, University of California, Irvine
Magdy S. Abadir, Motorola
pp. 122-131
Ganapathy Parthasarathy, University of California, Santa Barbara
Madhu K. Iyer, University of California, Santa Barbara
Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
Li-C. Wang, University of California, Santa Barbara
pp. 132-143
Rob Aitken, Artisan Components
Stefan Eichenberger, Philips Semiconductors
Sandip Kundu, Intel
Hank Walker, Texas A&M University
pp. 144-156
Departments
The Last Byte
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