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A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation
March/April 2004 (vol. 21 no. 2)
pp. 111-120
ASCII Text
x 
 
Chia-Chih Yen, Jing-Yang Jou, Kuang-Chien Chen, "A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation," IEEE Design & Test of Computers, vol. 21, no. 2, pp. 111-120, March/April, 2004.
 
 
BibTex
x
 
@article{ 10.1109/MDT.2004.1277903,
author = {Chia-Chih Yen and Jing-Yang Jou and Kuang-Chien Chen},
title = {A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation},
journal ={IEEE Design & Test of Computers},
volume = {21},
number = {2},
issn = {0740-7475},
year = {2004},
pages = {111-120},
doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1277903},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - MGZN
JO - IEEE Design & Test of Computers
TI - A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation
IS - 2
SN - 0740-7475
SP111
EP120
EPD - 111-120
A1 - Chia-Chih Yen,
A1 - Jing-Yang Jou,
A1 - Kuang-Chien Chen,
PY - 2004
VL - 21
JA - IEEE Design & Test of Computers
ER -
 
Chia-Chih Yen, National Chiao Tung University
Jing-Yang Jou, National Chiao Tung University
Kuang-Chien Chen, Cadence Design Systems
Divide-and-conquer is a natural way to cope with the complexity of automatic testbench generation. The key to developing an effective divide-and-conquer approach is to identify the partitioning boundaries where interactions among divided components are minimized. The authors propose a novel design decomposition scheme and show how it can help improve the performance of constraint solving for test generation.
Citation:
Chia-Chih Yen, Jing-Yang Jou, Kuang-Chien Chen, "A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation," IEEE Design & Test of Computers, vol. 21, no. 2, pp. 111-120, March-April 2004, doi:10.1109/MDT.2004.1277903
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