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March/April 2004 (vol. 21 no. 2)
pp. 80-82
| ASCII Text | x | ||
| Magdy S. Abadir, Li-C. Wang, "Guest Editors' Introduction: The Verification and Test of Complex Digital ICs," IEEE Design & Test of Computers, vol. 21, no. 2, pp. 80-82, March/April, 2004. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2004.1277899, author = {Magdy S. Abadir and Li-C. Wang}, title = {Guest Editors' Introduction: The Verification and Test of Complex Digital ICs}, journal ={IEEE Design & Test of Computers}, volume = {21}, number = {2}, issn = {0740-7475}, year = {2004}, pages = {80-82}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2004.1277899}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - Guest Editors' Introduction: The Verification and Test of Complex Digital ICs IS - 2 SN - 0740-7475 SP80 EP82 EPD - 80-82 A1 - Magdy S. Abadir, A1 - Li-C. Wang, PY - 2004 VL - 21 JA - IEEE Design & Test of Computers ER - | |||
Citation:
Magdy S. Abadir, Li-C. Wang, "Guest Editors' Introduction: The Verification and Test of Complex Digital ICs," IEEE Design & Test of Computers, vol. 21, no. 2, pp. 80-82, March-April 2004, doi:10.1109/MDT.2004.1277899
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