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Issue No.02 - March/April (2004 vol.21)
pp: 80-82
Magdy S. Abadir , Motorola
Li-C. Wang , University of California, Santa Barbara
CITATION
Magdy S. Abadir, Li-C. Wang, "Guest Editors' Introduction: The Verification and Test of Complex Digital ICs", IEEE Design & Test of Computers, vol.21, no. 2, pp. 80-82, March/April 2004, doi:10.1109/MDT.2004.1277899
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