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March/April 2004 (vol. 21 no. 2)
pp. 77-78
Rajesh Gupta, Editor in Chief, IEEE Design & Test
Citation:
Rajesh Gupta, "Past successes, future challenges," IEEE Design & Test of Computers, vol. 21, no. 2, pp. 77-78, March-April 2004, doi:10.1109/MDT.2004.1277897
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