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IEEE Design & Test of Computers
January/February 2004 (vol. 21 no. 1)
ISSN: 0740-7475
Table of Contents
EIC Message
Rajesh Gupta, Editor in Chief, IEEE Design & Test
pp. 1
Louise Trevillyan, IBM T.J. Watson Research Center
David Kung, IBM T.J. Watson Research Center
Ruchir Puri, IBM T.J. Watson Research Center
Lakshmi N. Reddy, IBM Microelectronics Division
Michael A. Kazda, IBM Microelectronics Division
pp. 14-22
Nontheme Features
Bin-Hong Lin, Intellectual Property Library Co.
Cheng-Wen Wu, National Tsing Hua University
Hwei-Tsu Ann Luh, Taiwan Semiconductor Manufacturing Co.
pp. 34-43
Sule Ozev, Duke University
Ismet Bayraktaroglu, Sun Microsystems
Alex Orailoglu, University of California, San Diego
pp. 44-55
Hans-Joachim Wunderlich, University of Stuttgart
Sandeep K. Shukla, Virginia Tech
pp. 65-66
Conference Reports (Abstract)
Xiaowei Li, Institute of Computing Technology, Chinese Academy of Sciences
pp. 68
The Last Byte
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