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Seamless Test of Digital Components in Mixed-Signal Paths
January/February 2004 (vol. 21 no. 1)
pp. 44-55
Sule Ozev, Duke University
Ismet Bayraktaroglu, Sun Microsystems
Alex Orailoglu, University of California, San Diego

For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. This article offers an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.

Citation:
Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu, "Seamless Test of Digital Components in Mixed-Signal Paths," IEEE Design & Test of Computers, vol. 21, no. 1, pp. 44-55, Jan.-Feb. 2004, doi:10.1109/MDT.2004.1261849
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