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Issue No.01 - January/February (2004 vol.21)
pp: 34-43
Bin-Hong Lin , Intellectual Property Library Co.
Cheng-Wen Wu , National Tsing Hua University
Hwei-Tsu Ann Luh , Taiwan Semiconductor Manufacturing Co.
ABSTRACT
<p>The Procorrelation System (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.</p>
CITATION
Bin-Hong Lin, Cheng-Wen Wu, Hwei-Tsu Ann Luh, "Efficient and Economical Test Equipment Setup Using Procorrelation", IEEE Design & Test of Computers, vol.21, no. 1, pp. 34-43, January/February 2004, doi:10.1109/MDT.2004.1261848
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