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Efficient and Economical Test Equipment Setup Using Procorrelation
January/February 2004 (vol. 21 no. 1)
pp. 34-43
Bin-Hong Lin, Intellectual Property Library Co.
Cheng-Wen Wu, National Tsing Hua University
Hwei-Tsu Ann Luh, Taiwan Semiconductor Manufacturing Co.

The Procorrelation System (PCS) obtains a high-quality correlation between die failures on a premanufactured recorded correlation wafer and the test equipment setup for the current wafer lot. PCS greatly reduces analysis time and test cost, compared with conventional full-wafer probing and offers significant benefits for deep-submicron ICs.

Citation:
Bin-Hong Lin, Cheng-Wen Wu, Hwei-Tsu Ann Luh, "Efficient and Economical Test Equipment Setup Using Procorrelation," IEEE Design & Test of Computers, vol. 21, no. 1, pp. 34-43, Jan.-Feb. 2004, doi:10.1109/MDT.2004.1261848
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