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IEEE Design & Test of Computers
November/December 2003 (vol. 20 no. 6)
ISSN: 0740-7475
Table of Contents
From the EIC
Features
Soha Hassoun, Tufts University
Yong-Bin Kim, Northeastern University
Fabrizio Lombardi, Northeastern University
pp. 5-8
Alain J. Martin, California Institute of Technology
Mika Nystr?, California Institute of Technology
Catherine G. Wong, California Institute of Technology
pp. 9-17
Satish K. Bandapati, University of Missouri-Rolla
Scott C. Smith, University of Missouri-Rolla
Minsu Choi, University of Missouri-Rolla
pp. 26-36
Juha Plosila, University of Turku
Tiberiu Seceleanu, University of Turku
Pasi Liljeberg, University of Turku
pp. 44-50
Special Section: Perspectives in EDA
The Tides of EDA (Abstract)
Alberto Sangiovanni-Vincentelli, University of California at Berkeley
pp. 59-75
The Road Ahead
Standards
Panel Summaries
Panel Summaries (Abstract)
Eric Dupont, iRoC Technologies
Grant Martin, Cadence
pp. 100-102
Conference Reports
Conference Reports (Abstract)
Vladimir Hahanov, Kharkov National University of Radioelectronics
Raimund Ubar, Tallinn Technical University
pp. 103
Newsletters
Annual Index
The Last Byte
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