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AC Scan Path Selection for Physical Debugging
September/October 2003 (vol. 20 no. 5)
pp. 34-40
Jason Doege, Inovys

Editor's note:
Commercial EDA tools support critical-path identification, as well as transition and path delay ATPG. But how can you narrow down the target faults or paths, and which ATPG technique should you use? The authors present a practical methodology addressing these important questions.
—Ken Butler, Texas Instruments

Citation:
Alfred L. Crouch, John C. Potter, Jason Doege, "AC Scan Path Selection for Physical Debugging," IEEE Design & Test of Computers, vol. 20, no. 5, pp. 34-40, Sept.-Oct. 2003, doi:10.1109/MDT.2003.1232254
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