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Issue No.05 - September/October (2003 vol.20)
pp: 6-7
Kenneth M. Butler , Texas Instruments
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
Li-C. Wang , University of California, Santa Barbara
CITATION
Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang, "Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs", IEEE Design & Test of Computers, vol.20, no. 5, pp. 6-7, September/October 2003, doi:10.1109/MDT.2003.1232250
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