This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
Compacting Test Responses for Deeply Embedded SoC Cores
July/August 2003 (vol. 20 no. 4)
pp. 22-30
Ozgur Sinanoglu, University of California, San Diego
Alex Orailoglu, University of California, San Diego

Test bandwidth allocation issues greatly limit parallel testing of SoC cores. Here, the authors propose a response compaction methodology for reducing the required output core bandwidth, enabling increased parallelism among core tests and hence reducing overall SoC test time.

Citation:
Ozgur Sinanoglu, Alex Orailoglu, "Compacting Test Responses for Deeply Embedded SoC Cores," IEEE Design & Test of Computers, vol. 20, no. 4, pp. 22-30, July-Aug. 2003, doi:10.1109/MDT.2003.1214349
Usage of this product signifies your acceptance of the Terms of Use.