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TTTC Newsletter
May/June 2003 (vol. 20 no. 3)
pp. 116-117
| ASCII Text | x | ||
| "TTTC Newsletter," IEEE Design & Test of Computers, vol. 20, no. 3, pp. 116-117, May/June, 2003. | |||
| BibTex | x | ||
| @article{ 10.1109/MDT.2003.10020, author = {}, title = {TTTC Newsletter}, journal ={IEEE Design & Test of Computers}, volume = {20}, number = {3}, issn = {0740-7475}, year = {2003}, pages = {116-117}, doi = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.10020}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - MGZN JO - IEEE Design & Test of Computers TI - TTTC Newsletter IS - 3 SN - 0740-7475 SP116 EP117 EPD - 116-117 PY - 2003 VL - 20 JA - IEEE Design & Test of Computers ER - | |||
Citation:
"TTTC Newsletter," IEEE Design & Test of Computers, vol. 20, no. 3, pp. 116-117, May-June 2003, doi:10.1109/MDT.2003.10020
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