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Issue No.03 - May/June (2003 vol.20)
pp: 68-77
Md. Saffat Quasem , University of Southern California
Zhigang Jiang , University of Southern California
Sandeep K. Gupta , University of Southern California
ABSTRACT
<p><em>Editor?s note:</em><div>The tradeoff between IP protection and SoC-level test optimization has been an issue for some time. The more IP providers protect their IP, the less flexibility system developers have to control test costs and fault coverage. Here, a new approach dynamically extracts IP-related test information for optimizing SoC testing without jeopardizing IP protection.</div><div>--Yervant Zorian, Virage Logic</div></p>
CITATION
Md. Saffat Quasem, Zhigang Jiang, Sandeep K. Gupta, "Benefits of a SoC-Specific Test Methodology", IEEE Design & Test of Computers, vol.20, no. 3, pp. 68-77, May/June 2003, doi:10.1109/MDT.2003.1198688
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