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Issue No.03 - May/June (2003 vol.20)
pp: 50-57
Alfredo Benso , Politecnico di Torino
Stefano Di Carlo , Politecnico di Torino
Giorgio Di Natale , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
ABSTRACT
<p><em>Editor?s note:</em><div>Chip-level failure detection has been a target of research for some time, but today?s very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today?s chips. This article introduces a self-repair solution for the digital FIR filter, one of the key blocks used in DSPs.</div><div>--Yervant Zorian, Virage Logic</div></p>
CITATION
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, "Online Self-Repair of FIR Filters", IEEE Design & Test of Computers, vol.20, no. 3, pp. 50-57, May/June 2003, doi:10.1109/MDT.2003.1198686
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