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Online Self-Repair of FIR Filters
May/June 2003 (vol. 20 no. 3)
pp. 50-57
Alfredo Benso, Politecnico di Torino
Stefano Di Carlo, Politecnico di Torino
Giorgio Di Natale, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino

Editor?s note:

Chip-level failure detection has been a target of research for some time, but today?s very deep-submicron technology is forcing such research to move beyond detection. Repair, especially self-repair, has become very important for containing the susceptibility of today?s chips. This article introduces a self-repair solution for the digital FIR filter, one of the key blocks used in DSPs.
--Yervant Zorian, Virage Logic

Citation:
Alfredo Benso, Stefano Di Carlo, Giorgio Di Natale, Paolo Prinetto, "Online Self-Repair of FIR Filters," IEEE Design & Test of Computers, vol. 20, no. 3, pp. 50-57, May-June 2003, doi:10.1109/MDT.2003.1198686
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