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IEEE Design & Test of Computers
March/April 2003 (vol. 20 no. 2)
ISSN: 0740-7475
Table of Contents
EIC Message
Features
Monica Lobetti-Bodoni, Siemens Mobile Communications
R.G.(Ben) Bennetts, Bennetts Associates
pp. 5-7
Erik Jan Marinissen, Philips Research Laboratories
Bart Vermeulen, Philips Research Laboratories
Henk Hollmann, Philips Research Laboratories
R.G.(Ben) Bennetts, Bennetts Associates
pp. 8-18
Special Features
Nur Engin, Philips Research Laboratories
Hans G. Kerkhoff, MESA+ Research Institute
pp. 40-47
Chien-Nan Jimmy Liu, National Chiao Tung University
I-Ling Chen, National Chiao Tung University
Jing-Yang Jou, National Chiao Tung University
pp. 48-55
Round Table
Conference Reports
Panel Summaries
Newsletters
TTTC Newsletter (Abstract)
pp. 94-95
The Last Byte
Testing for what? (Abstract)
Kenneth P. Parker, Agilent Technologies
pp. 96
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